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Optimization of process parameters of titanium dioxide films by response surfaces methodology

机译:响应面法优化二氧化钛薄膜的工艺参数

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摘要

An efficient approach for determination of the optimum process parameters for titanium dioxide coatings by using second-order response surface model is presented and investigated experimentally. Thin films were prepared by electron-beam evaporation associated with ion-beam assisted deposition by using different control factors, including starting materials, working pressure, substrate temperature, deposition rate and annealing temperature. The factorial design of the experiment was established to meet the equipment conditions and to avoid affecting the results. The main effect between various factors and interactions are independent. The significant level of both the main effects and the interaction are observed by analysis of variance (ANOVA) approach. Based on the statistical analysis, the results have provided much valuable information on the relationship between various control factors and thin film properties. Besides the optimum optical constants and surface roughness of TiO_(2) thin films were obtained in the range of each parameter level. The factorial prediction model for preparation parameters of thin film was also established.
机译:提出并通过二阶响应表面模型确定二氧化钛涂层最佳工艺参数的有效方法。通过使用不同的控制因素,包括起始材料,工作压力,衬底温度,沉积速率和退火温度,通过与离子束辅助沉积相关的电子束蒸发制备薄膜。实验的析因设计是为了满足设备条件并避免影响结果而建立的。各种因素和相互作用之间的主要影响是独立的。通过方差分析(ANOVA)方法可以观察到主要影响和相互作用的显着水平。基于统计分析,结果为各种控制因素与薄膜特性之间的关系提供了很多有价值的信息。除了在每个参数水平的范围内获得了最佳的光学常数和TiO_(2)薄膜的表面粗糙度。建立了薄膜制备参数的阶乘预测模型。

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