Reconstruction of the complex reflection coefficient of multilayered structures from measurements of the multifrequency amplitude reflection characteristics

摘要

An approach to reconstructing the frequency dependences of the complex reflection coefficient of multilayered dielectric structures situated in free space is described. The method uses windows to the time signals, synthesized from the amplitudereflection characteristics, measured at multiple frequencies when there is a reference signal and an inverse Fourier transformation. Calibration problems are considered. The operation of the method is illustrated by the results of an actual experiment.