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Mapping of the quantitative trait loci (QTL) associated with grain quality characteristics of the bread wheat grown under different environmental conditions

机译:在不同环境条件下与面包小麦籽粒品质特性相关的数量性状基因座(QTL)图

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摘要

The quantitative trait loci (QTL) associated with individual characteristics of grain and flour quality in wheat lines grown under contrasting environmental conditions were mapped. Overall, 22 QTL that manifested under contrasting environmental conditions with various significances were detected on 10 chromosomes. Grain hardness and vitreousness were associated with three loci on chromosomes 5D, 6A, and 3A, while the gluten content, with two loci on chromosomes 5B and 7A. Dough extensibility was associated with only one QTL localized in the region of Glu-A1 locus. One of the loci determining flour and dough strengths is located in the region of Gli-B1 and Glu-B3 loci and the rest, in various regions of chromosomes 1B, 5D, and 4B, where no particular genes associated with grain quality have been yet found. The detected QTL can be used in further experiments on genetic control of gluten formation and quality in wheat.
机译:绘制了与在不同环境条件下生长的小麦品系的谷物和面粉品质的个体特征相关的定量性状位点(QTL)。总体上,在10条染色体上检测到22个QTL,这些QTL在不同的环境条件下具有不同的意义。谷物硬度和玻璃质与5D,6A和3A染色体上的三个基因座有关,而麸质含量与5B和7A染色体上的两个基因座有关。面团的延展性仅与一个位于Glu-A1基因座区域的QTL相关。决定面粉和面团强度的基因座之一位于Gli-B1和Glu-B3基因座区域,其余位于染色体1B,5D和4B的各个区域,而这些区域尚未与谷物品质相关的特定基因找到了。所检测的QTL可以用于小麦面筋形成和品质的遗传控制的进一步实验中。

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