A method of trajectory tracing of Z <= 10 ions in the energy region below 300 MeV/u

摘要

We present a method which enhances measurements of charge changing and other reactions with etched-track detectors by tracing the trajectories of charged particles through a stack of detectors. Using an automatic track-analysis system with a computer controlled microscope, we are able to measure absolute track positions with-an accuracy of better than 5 mum. The measured positions of the tracks from different detectors along the stack are combined using pattern-matching algorithms. For particles which undergo significant scattering from the original perpendicular direction, the trajectories are connected manually using a specially developed program which shows track positions throughout the stack. Using this technique we are able to analyze the destiny of each individual particle, thus reducing the error in the analysis and possible confusion with the background events such as radon tracks and bubbles in the detector. For this method to be operational, a complex track-information system using a database server and several client programs was developed. (C) 2001 Elsevier Science Ltd. All rights reserved. [References: 13]