An evaluation of radial track etch rate in LR-115 detectors exposed to Fe ions by means of FT-IR spectrometry

摘要

Chemical modification of LR-115 induced by the irradiation of gamma-ray and 147 MeV Fe ions has been observed. Density of O-NO2 and C-O-C bonds in the sheets was decreased. We also confirmed the modification by chemical etching during early stage in LR-115 exposed to Fe ions. The absorption band around 1740cm(-1) was reduced rapidly, which can be attributable to C=O bonds of some additives contained in LR-115. We have derived the radial track etch rate from the reduction of the absorbance,