Evaluation of Bulk Etch Rate of Solid State Nuclear Track Detector CR-39

摘要

In the current study, the bulk etch rate V_B of solid state nuclear track detectors SSNTDs CR-39 have been examined at different concentrations of NaOH solution ranged from 4N to 8N and different temperatures of NaOH solution (50, 60, 70, 80 C) for various time intervals of etching (1-10 h); this is done by determination of mass variation via etching time. The results indicate that the bulk etch rate V_B increases with the increase of etchant solution concentration and the temperature of solution. This can be attributed to the increase the thickness of the removed layers h of the detector.