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Correlation of track etching properties of SSNTDs with the density of free radicals produced by charged particles in PADC

机译:SADCTD的轨迹蚀刻特性与PADC中带电粒子产生的自由基密度的相关性

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摘要

In the present paper correlation between track etch properties like track diameter, track etch rate and detection sensitivity with the density of free radicals in irradiated PADC are examined and dSUcussed. The density of free radicals produced by irradiation with light charged particles has been studied in dependence on the temperature and the oxygen concentration by using the electron-spin-resonance (ESR) method. The influences of both environmental parameters on the density and the lifetime of the radicals are strongly correlated with the dependence of important track etch properties. The investigations have been performed for PADC of types TASTRAK and BARYOTRAK.
机译:在本文中,研究并讨论了辐照蚀刻特性(如轨迹直径,轨迹蚀刻速率和检测灵敏度)与辐射后的PADC中自由基密度之间的相关性。已经通过使用电子自旋共振(ESR)方法根据温度和氧气浓度研究了由带光粒子辐照产生的自由基的密度。环境参数对自由基的密度和寿命的影响都与重要的轨道蚀刻性能的依赖性密切相关。已经对TASTRAK和BARYOTRAK类型的PADC进行了调查。

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