FOCUSED LASER-BEAM SCANNING BY THE APERTURED PROBE OF A NEAR-FIELD MICROSCOPE

摘要

The focused-light scanning using the two-dimensional aperture probe is numerically simulated by the finite element method. The difficulties related to simulating the probe of the near-field scanning optical microscopy are considered. The patterns of the spatial distribution of the flux density in the focal spot, which are scanned by the probe, are obtained. The probe response corresponds to the transverse component of the electric field and the gradient of the longitudinal component of electric field in the cases of sharp focusing of the Gaussian beam and the Gaussian-Hermitean beam focusing, respectively.