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Hydrogenic impurity in two-dimensional semiconductors with anisotropic energy spectrum of carriers

机译:载流子各向异性能谱的二维半导体中的氢杂质

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摘要

The binding energy and wave function of a ground state of a shallow hydrogenic impurity in two-dimensional semiconductors with isotropic and anisotropie effective mass of carriers m{sup}* = {m{sup}⊥, m{sup}⊥, m{sup}‖} are derived. The calculations are performed by the variational method based on a two-parametric trial wave function. The dependence of binding energy and deformation of an impurity on 2D layer thickness and effective mass anisotropy parameter m{sup}⊥/m{sup}‖ is investigated. The obtained results are in a good agreement with experimental data and in the limiting cases coincide with the theoretical calculations of shallow impurity binding energy for bulk semiconductors [1] and two-dimensional semiconductors with isotropic effective mass of electrons [2].
机译:各向同性和各向异性有效载流子为m {sup} * = {m {sup}⊥,m {sup}⊥,m {sup}的二维半导体中浅氢杂质基态的结合能和波函数}‖}派生。通过基于二参数试验波函数的变分法进行计算。研究了结合能和杂质变形对二维层厚度和有效质量各向异性参数m {sup}⊥/ m {sup}”的依赖性。所得结果与实验数据吻合良好,在有限的情况下,与块状半导体[1]和具有各向同性有效电子质量的二维半导体[2]的浅层杂质结合能的理论计算吻合。

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