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首页> 外文期刊>Lasers in engineering >Effects of Doping Concentration on Al-doped ZnO Thin Films Prepared by Pulsed Laser Deposition (PLD)
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Effects of Doping Concentration on Al-doped ZnO Thin Films Prepared by Pulsed Laser Deposition (PLD)

机译:掺杂浓度对脉冲激光沉积(PLD)制备的Al掺杂ZnO薄膜的影响

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摘要

Al-doped zinc oxide (AZO) thin films have been prepared by pulsed laser deposition (PLD). The structural, electrical and optical properties of these films were investigated as a function of Al-doping amount (0 to 7 wt%) in the target. Films were deposited at a low substrate temperature of 100℃ under 10 Pa of oxygen pressure. It was observed that 3wt% of Al is the optimum doping amount in the target to achieve the minimum film resistivity.
机译:已经通过脉冲激光沉积(PLD)制备了掺铝的氧化锌(AZO)薄膜。研究了这些膜的结构,电学和光学性质,作为靶材中Al掺杂量(0至7 wt%)的函数。在100 Pa的低基板温度和10 Pa的氧气压力下沉积薄膜。观察到3wt%的Al是靶中达到最小膜电阻率的最佳掺杂量。

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