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机译:
Sandia Natl Labs, POB 5800, Albuquerque, NM 87185, USA.;
机译:Reversible stress relaxation during precoalescence interruptions of Volmer-Weber thin film growth - art. no. 126103
机译:Stress generation mechanisms in carbon thin films grown by ion-beam deposition
机译:Analysis of Degradation Mechanisms in Low-Temperature Polycrystalline Silicon Thin-Film Transistors under Dynamic Drain Stress