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首页> 外文期刊>New Diamond and Frontier Carbon Technology >Medium- to High-Pressure Plasma Deposition of Hydrogenated Amorphous Carbon Films by Dielectric Barrier Discharge
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Medium- to High-Pressure Plasma Deposition of Hydrogenated Amorphous Carbon Films by Dielectric Barrier Discharge

机译:介质阻挡放电对氢化非晶碳膜的中高压等离子体沉积

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In this study, we evaluated and compared the surface roughness, structure and mechanical properties of hydrogenated amorphous carbon (a-C:H) films prepared by a CH{sub}4-dielectric barrier discharge (DBD) plasma, at medium (100-500 Pa) and atmospheric (1.0×10{sup}5Pa) pressure. The effects of power frequency, deposition pressure and Pd value (the product of CH{sub}4 pressure P, and discharge gas spacing d) on film quality were analyzed and the electrical characteristics of the discharge were discussed. The objective of this study was to explore whether hard a-C:H films with smooth surfaces can be deposited by the technique at medium and higher pressures. The quality of deposited films was mainly determined by the power frequency and Pel value. Increasing the power frequency from 50 Hz to 1.4 kHz causes an obvious increase of deposition rate and film hardness. The higher substrate temperature produced at 20 kHz power frequency leads to the transition from hard diamond-like to soft graphite-like film characteristics. The glow-like DBD plasma produced at smaller Pd value (typically 0.26 Pa·m) contributes to the formation of hard a-C:H films with smooth surfaces. The atmospheric DBD plasma at higher Pd value leads to the deposition of a soft polymer-like a-C:H film with rough surface. It appears to be difficult to prepare hard a-C:H films with smooth surfaces at higher pressure (>10{sup}4 Pa) by reducing the gas spacing due to the formation of a large electric field in the dielectric. In this paper we also review the DBD-induced a-C:H film deposition technique.
机译:在这项研究中,我们评估并比较了在中等压力(100-500 Pa)下通过CH {sub} 4-介电势垒放电(DBD)等离子体制备的氢化非晶碳(aC:H)膜的表面粗糙度,结构和力学性能。 )和大气压(1.0×10 {sup} 5Pa)的压力。分析了工频,沉积压力和Pd值(CH {sub} 4压力P与放电气体间距d的乘积)对薄膜质量的影响,并讨论了放电的电学特性。这项研究的目的是探讨是否可以通过该技术在中等和较高压力下沉积具有光滑表面的硬质a-C:H膜。沉积膜的质量主要取决于功率频率和Pel值。功率频率从50 Hz增加到1.4 kHz会导致沉积速率和膜硬度的明显增加。在20 kHz功率频率下产生的较高的基板温度导致从硬类金刚石到软类石墨膜的转变。以较小的Pd值(通常为0.26 Pa·m)产生的类似辉光的DBD等离子体有助于形成具有光滑表面的硬a-C:H膜。 Pd值较高的大气DBD等离子体会导致形成具有粗糙表面的类聚合物软质a-C:H膜。通过减小由于在电介质中形成大电场而引起的气体间距,似乎难以在较高的压力(> 10 {sup} 4 Pa)下制备具有光滑表面的硬质a-C:H膜。在本文中,我们还回顾了DBD诱导的a-C:H膜沉积技术。

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