A few-femtosecond X-ray streak camera has been realized using a pump-probe scheme that samples the transient response of matter to ionizing soft X-ray radiation in the presence of an intense synchronized terahertz field. Borrowing its concept from attosecond metrology, the femtosecond X-ray streak camera fills the gap between conventional streak cameras with typical resolutions of hundreds of femtoseconds and streaking techniques operating in the sub-femtosecond regime. Its single-shot capability permits the duration and time structure of individual X-ray pulses to be determined. For several classes of experiments in time-resolved spectroscopy, diffraction or imaging envisaged with novel accelerator-and laser-based short-pulse X-ray sources this knowledge is essential, but represents a major challenge to X-ray metrology. Here we report on the single-shot characterization of soft X-ray pulses from the free-electron laser facility FLASH.
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