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FLASH free-electron laser single-shot temporal diagnostic: terahertz-field-driven streaking

机译:FLASH自由电子激光单次时间诊断:太赫兹场驱动的条纹

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摘要

The commissioning of a terahertz-field-driven streak camera installed at the free-electron laser (FEL) FLASH at DESY in Hamburg, being able to deliver photon pulse duration as well as arrival time information with ∼10 fs resolution for each single XUV FEL pulse, is reported. Pulse durations between 300 fs and <15 fs have been measured for different FLASH FEL settings. A comparison between the XUV pulse arrival time and the FEL electron bunch arrival time measured at the FLASH linac section exhibits a correlation width of 20 fs r.m.s., thus demonstrating the excellent operation stability of FLASH. In addition, the terahertz-streaking setup was operated simultaneously to an alternative method to determine the FEL pulse duration based on spectral analysis. FLASH pulse duration derived from simple spectral analysis is in good agreement with that from terahertz-streaking measurement.
机译:安装在汉堡DESY的自由电子激光(FEL)闪光灯上的太赫兹场驱动条纹相机的调试,能够为每个XUV FEL提供约10 pulsefs分辨率的光子脉冲持续时间和到达时间信息脉搏,据报道。对于不同的FLASH FEL设置,已测量了300 fs和<15 fs之间的脉冲持续时间。 XUV脉冲到达时间与在FLASH直线加速器部分测得的FEL电子束到达时间之间的比较显示出20 fs r.m.s.的相关宽度,因此证明了FLASH具有出色的操作稳定性。此外,太赫兹条纹设置与另一种方法同时运行,可基于频谱分析确定FEL脉冲持续时间。通过简单的频谱分析得出的FLASH脉冲持续时间与太赫兹条纹测量的持续时间非常吻合。

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