Bias Voltage Dependence of Silver and Molybdenum Single-Atom-Width Wire Formation

摘要

We elongated silver (Ag) and molybdenum (Mo) nanocontacts under an applied bias voltage inside a transmission electron microscope (TEM). The elongation process was observed in situ by lattice imaging. Single-atom-width wires (SWs) of both metals formed over certain bias voltage ranges. We investigated the probability of SW formation over a range of bias voltages. The Ag SW formation probability was lower at high bias voltages. No Ag SWs were formed at voltages higher than 20 mV. Conversely, the formation probability of Mo SWs showed no dependence on bias voltage in the range 0-150 mV.