...
首页> 外文期刊>Nanotechnology >Direct probe of heterojunction effects upon photoconductive properties of TiO_2 nanotubes fabricated by atomic layer deposition
【24h】

Direct probe of heterojunction effects upon photoconductive properties of TiO_2 nanotubes fabricated by atomic layer deposition

机译:直接研究异质结对原子层沉积制备的TiO_2纳米管光电导性能的影响

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

This study investigated Schottky-and ohmic-contact effects upon the photoresponses of ITO/TiO_2/Si and Ti/TiO_2/Si nanotube-based photodiodes. The TiO_2 tube arrays were fabricated by atomic layer deposition (ALD) and shaped by an anodic aluminum oxide (AAO) template on a p-type Si substrate. The contact area between the electrode (Ti or ITO) and the TiO_2's tip was varied by tuning the tube's inner wall thickness with ALD, providing a direct and systematic probe of the heterojunction effects upon the photodiodes' responses. Results show that the Ti/TiO_2/Si diode exhibits a highly thickness-dependent photoresponse. This is because the photocurrent is driven by the p-n junction at TiO _2/Si alone and it faces no retarding at the ohmic contact of Ti/TiO_2. For the ITO/TiO_2/Si diode, the Schottky contact at ITO/TiO_2 regulates photocurrent overriding TiO_2/Si as a result of higher efficiency in photogeneration, leading to the opposite response compared with the Ti/TiO_2/Si diode. Respective energy band diagrams are provided to support the statements above, and a consistent picture is obtained for both time response and quantum efficiency measurements.
机译:本研究研究了肖特基和欧姆接触效应对ITO / TiO_2 / Si和Ti / TiO_2 / Si纳米管基光电二极管的光响应的影响。 TiO_2管阵列通过原子层沉积(ALD)制成,并通过阳极氧化铝(AAO)模板在p型Si衬底上成形。电极(Ti或ITO)与TiO_2尖端之间的接触面积可通过用ALD调节管的内壁厚度来改变,从而提供了对光电二极管响应的异质结效应的直接而系统的探测。结果表明,Ti / TiO_2 / Si二极管具有高度的厚度依赖性光响应。这是因为光电流仅由TiO _2 / Si处的p-n结驱动,并且在Ti / TiO_2的欧姆接触处没有受到阻碍。对于ITO / TiO_2 / Si二极管,由于光生效率更高,因此ITO / TiO_2上的肖特基接触调节了覆盖TiO_2 / Si的光电流,与Ti / TiO_2 / Si二极管相比,产生了相反的响应。提供了各自的能带图以支持上述陈述,并且为时间响应和量子效率测量获得了一致的图像。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号