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首页> 外文期刊>Nanotechnology >Improved voltage margins using linear error-correcting codes in resistor-logic demultiplexers for nanoelectronics
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Improved voltage margins using linear error-correcting codes in resistor-logic demultiplexers for nanoelectronics

机译:在纳米电子电阻器-逻辑多路分配器中使用线性纠错码提高了电压裕度

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摘要

We present a family of demultiplexer circuit designs based on linear error-correcting codes, which can be laid out on nanoelectronic crossbar structures. The crossbars are assumed to have configurable resistors at the crosspoint junctions, and the demultiplexer circuits are therefore implemented using resistor logic. In general, resistor logic offers poor vollage margins when implementing digital circuits, but the circuit construction we present allows us to circumvent this problem by capitalizing on the minimum-distance property of codes to avoid certain problem cases, and thus achieve a much larger voltage margin. For each linear code, there is corresponding demultiplexer circuit prescribed by this construction, and this a large family of demultiplexer circuits is defined. When a demultiplexer of a given size is needed in a system, this circuit family offers to the designer a set of alternative demultiplexer circuit designs, in which in creasing voltage margins can be achieved, but at the cost of increasing circuit area. We analyse a demultiplexer circuit based on an arbitrary linear code. For this general case, we give the encoding computation prescribed by toe code, give the configuration pattern prescribed by the code for the crossbar part of the circuit, calculate the output voltage on each of the demux output lines as a function of the current input signal, calculate the worst-case voltage margin, and calculate cost parameters measuring the increased area consumed by the circuit. This code-based demultiplexer circuit design relies it possible to handle the voltage-margin problem of resistor logic, and thus makes it feasible to build relatively large demultiplexers using nano-scale crossbars with configurable resistors at the crossbar junctions.
机译:我们提出了一种基于线性纠错码的解复用器电路设计系列,可以将其布置在纳米电子交叉开关结构上。假设交叉开关在交叉点结点处具有可配置的电阻器,因此使用电阻器逻辑实现解复用器电路。通常,电阻器逻辑在实现数字电路时会提供较差的波动余量,但是我们介绍的电路结构使我们能够通过利用代码的最小距离特性来避免某些问题,从而避免了这个问题,从而获得了更大的电压余量。对于每个线性码,由该结构规定了相应的解复用器电路,并且这定义了一大类解复用器电路。当系统中需要给定大小的多路分解器时,该电路系列为设计人员提供了一组可供选择的多路分解器电路设计,在这些设计中可以实现增加的电压裕量,但以增加电路面积为代价。我们分析基于任意线性代码的解复用器电路。对于这种一般情况,我们给出脚趾代码规定的编码计算,给出代码的电路交叉开关部分规定的配置模式,根据当前输入信号计算每路解复用器输出线上的输出电压,计算最坏情况下的电压裕度,并计算成本参数,以测量电路消耗的增加面积。这种基于代码的多路分解器电路设计有可能处理电阻器逻辑的电压裕量问题,因此使在纳米级交叉器中在交叉开关结处使用可配置电阻器来构建相对较大的多路分离器成为可能。

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