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Modulation of contact resonance frequency accompanying atomic-scale stick-slip in friction force microscopy

机译:摩擦力显微镜中伴随原子尺度粘滑的接触共振频率的调制

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Novel phenomena accompanying atomic-scale friction are studied on NaCl(001) by the combination of quasistatic lateral force measurements with dynamic measurements of contact resonance frequencies. For loads up to a few nN the flexural resonance is tracked by a phase-locked-loop by the use of small oscillation amplitude (50 pm). The contact resonance varies during the stick stages, which demonstrates that the dynamic measurement provides additional information about small changes of the stressed contact. Improved sensitivity is also observed across atomic-scale defects which are clearly observed in the contact frequency channel. The low lateral contact stiffness inferred from the observed torsional resonance agrees well with that deduced from the quasistatic measurements and strongly suggests that the contact is atomic-sized.
机译:通过准静态侧向力测量与接触共振频率的动态测量相结合,在NaCl(001)上研究了伴随原子级摩擦的新型现象。对于高达几nN的负载,锁相环通过使用较小的振荡幅度(50 pm)来跟踪挠曲共振。在粘着阶段,接触共振会发生变化,这表明动态测量可提供有关应力接触的微小变化的其他信息。在原子级缺陷上也观察到了提高的灵敏度,这些缺陷在接触频率通道中可以清楚地观察到。由观察到的扭转共振推断出的较低的侧向接触刚度与从准静态测量得出的结果十分吻合,并强烈表明接触是原子级的。

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