首页> 外文期刊>Nanotechnology >Electrical bistabilities and operating mechanisms of memory devices fabricated utilizing ZnO quantum dot—multi-walled carbon nanotube nanocomposites
【24h】

Electrical bistabilities and operating mechanisms of memory devices fabricated utilizing ZnO quantum dot—multi-walled carbon nanotube nanocomposites

机译:ZnO量子点—多壁碳纳米管纳米复合材料制备的存储器件的电双稳态和工作机理

获取原文
获取原文并翻译 | 示例
       

摘要

Transmission electron microscopy images showed that the ZnO quantum dots (QDs) were conjugated with multi-walled carbon nanotubes (MWCNTs). Bistable memories utilizing an ensemble of the ZnO QD–MWCNT heterostructures were developed and the storage capability of the devices was significantly enhanced due to the conjugation of the ZnO QDs and the MWCNTs. Operating mechanisms of memory devices fabricated utilizing the ZnO QD–MWCNT heterostructures are described on the basis of the current–voltage results. The memory devices exhibited excellent environmental stability at ambient conditions.
机译:透射电子显微镜图像显示,ZnO量子点(QD)与多壁碳纳米管(MWCNT)共轭。开发了利用ZnO QD-MWCNT异质结构的整体的双稳态存储器,并且由于ZnO QD和MWCNT的结合,显着增强了器件的存储能力。基于电流-电压结果描述了利用ZnO QD-MWCNT异质结构制造的存储器件的工作机制。该存储器件在环境条件下表现出出色的环境稳定性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号