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Nanoscale mechanical characteristics of vertical ZnO nanowires grown on ZnO:Ga/glass templates

机译:在ZnO:Ga /玻璃模板上生长的垂直ZnO纳米线的纳米尺度机械特性

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The mechanical properties of vertical single-crystal ZnO nanowires on ZnO:Ga/glass templates were characterized by nanoindentation experiments in this work. The results from x-ray diffraction and Raman spectra show good crystal quality for the ZnO nanowires. The buckling loads were found to be 1465 and 215 mu N for ZnO nanowires of 100 and 30 nm diameters, respectively. When the fixed-fixed column mode was used, it was found that the Young's modulus values of the ZnO nanowires of 100 and 30 nm diameters were 117 and 232 GPa, while the critical buckling strains were 0.62 percent and 0.35 percent, respectively. On the other hand, when we employed the fixed-pinned column mode, it can be seen that the Young's modulus values were 229 and 454 GPa, while the critical buckling strains were 0.32 percent and 0.18 percent, respectively. Buckling behaviour of the ZnO nanowires was significantly predicted by the Euler buckling model in this work.
机译:通过纳米压痕实验对ZnO:Ga /玻璃模板上垂直单晶ZnO纳米线的力学性能进行了表征。 X射线衍射和拉曼光谱的结果表明ZnO纳米线具有良好的晶体质量。对于直径为100和30 nm的ZnO纳米线,屈曲载荷分别为1465和215μN。当使用固定-固定柱模式时,发现直径为100和30 nm的ZnO纳米线的杨氏模量值为117和232 GPa,而临界屈曲应变分别为0.62%和0.35%。另一方面,当我们采用固定销柱模式时,可以看出杨氏模量值为229和454 GPa,而临界屈曲应变分别为0.32%和0.18%。这项工作中的Euler屈曲模型显着预测了ZnO纳米线的屈曲行为。

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