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Sub-50 nm positioning of organic compounds onto silicon oxide patterns fabricated by local oxidation nanolithography

机译:通过局部氧化纳米光刻技术将有机化合物在50 nm以下的位置定位在氧化硅图案上

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摘要

We present a process to fabricate molecule-based nanostructures by merging a bottom-up interaction and a top-down nanolithography. Direct nanoscale positioning arises from the attractive electrostatic interactions between the molecules and silicon dioxide nanopatterns. Local oxidation nanolithography is used to fabricate silicon oxide domains with variable gap separations ranging from 40 nm to several microns in length. We demonstrate that an ionic tetrathiafulvalene (TTF) semiconductor can be directed from a macroscopic liquid solution (1 mu M) and selectively deposited onto predefined nanoscale regions of a 1 cm(2) silicon chip with an accuracy of 40 nm.
机译:我们提出了一种通过合并自下而上的相互作用和自上而下的纳米光刻技术来制造基于分子的纳米结构的过程。直接的纳米级定位源于分子与二氧化硅纳米图案之间有吸引力的静电相互作用。局部氧化纳米光刻技术用于制造氧化硅畴,其可变间隙间隔的长度范围为40 nm至几微米。我们证明离子四硫富瓦烯(TTF)半导体可以从宏观液体溶液(1μM)定向并选择性地以40 nm的精度沉积到1 cm(2)硅芯片的预定纳米级区域上。

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