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Comparing schemes of displacement detection and subharmonic generation in nanomachined mechanical resonators

机译:纳米机械谐振器中位移检测与次谐波产生的比较方案

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We present measurements on nanomechanical resonators operating in the radio frequency range. We apply a set-up which allows the comparison of two schemes of displacement detection for mechanical resonators, namely conventional power reflection measurements of a probing signal and direct detection by capacitive coupling via a gate electrode. For capacitive detection, we employ a preamplifier, mounted close to the sample and connected to it via bond wires, which enables direct measurements of the resonator's displacement. We observe that the response of the mechanical resonator depends on the detection technique applied, which is verified in model calculations. We show results for the detection of subharmonics.
机译:我们介绍了在射频范围内工作的纳米机械谐振器的测量结果。我们应用了一种设置,该设置允许比较机械谐振器的两种位移检测方案,即探测信号的常规功率反射测量和通过栅电极的电容耦合直接检测。对于电容式检测,我们使用了一个前置放大器,该放大器安装在靠近样品并通过键合线连接到样品的位置,从而可以直接测量谐振器的位移。我们观察到机械谐振器的响应取决于所应用的检测技术,这在模型计算中得到了验证。我们显示了用于检测次谐波的结果。

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