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Fabrication of single-crystal ZnO film by Zn ion implantation and subsequent annealing

机译:Zn离子注入及随后的退火工艺制备单晶ZnO薄膜

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摘要

Zn ions were implanted at 160 keV into silica at a dose of 2 x 10(17) ions cm(-2). Cross-sectional transmission electron microscopy and x-ray photoelectron spectroscopy studies show that a film of ZnO nanoclusters was formed after the implanted sample was annealed at 700 degrees C in air. With the increase in annealing temperature to 750 degrees C, a single-crystal ZnO film was fabricated. The mechanisms for the formation of single- crystal ZnO films are discussed. The optical absorption and PL spectra of ZnO films are also studied.
机译:Zn离子以2 x 10(17)离子cm(-2)的剂量以160 keV注入到二氧化硅中。截面透射电子显微镜和X射线光电子能谱研究表明,将注入的样品在700摄氏度的空气中退火后,形成了ZnO纳米团簇膜。随着退火温度增加到750℃,制造了单晶ZnO膜。讨论了单晶ZnO膜的形成机理。还研究了ZnO薄膜的光吸收和PL光谱。

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