首页> 外文期刊>Nano letters >Large thermoelectric figure-of-merits from SiGe nanowires by simultaneously measuring electrical and thermal transport properties
【24h】

Large thermoelectric figure-of-merits from SiGe nanowires by simultaneously measuring electrical and thermal transport properties

机译:通过同时测量电和热传输特性,从SiGe纳米线获得大型热电品质因数

获取原文
获取原文并翻译 | 示例
           

摘要

The strongly correlated thermoelectric properties have been a major hurdle for high-performance thermoelectric energy conversion. One possible approach to avoid such correlation is to suppress phonon transport by scattering at the surface of confined nanowire structures. However, phonon characteristic lengths are broad in crystalline solids, which makes nanowires insufficient to fully suppress heat transport. Here, we employed Si-Ge alloy as well as nanowire structures to maximize the depletion of heat-carrying phonons. This results in a thermal conductivity as low as ~1.2 W/m-K at 450 K, showing a large thermoelectric figure-of-merit (ZT) of ~0.46 compared with those of SiGe bulks and even ZT over 2 at 800 K theoretically. All thermoelectric properties were "simultaneously" measured from the same nanowires to facilitate accurate ZT measurements. The surface-boundary scattering is prominent when the nanowire diameter is over ~100 nm, whereas alloying plays a more important role in suppressing phonon transport for smaller ones.
机译:高度相关的热电特性一直是高性能热电能量转换的主要障碍。避免这种相关性的一种可能方法是通过限制纳米线结构表面的散射来抑制声子传输。然而,声子特征长度在结晶固体中很宽,这使得纳米线不足以完全抑制热传递。在这里,我们采用Si-Ge合金以及纳米线结构来最大化载热声子的损耗。这导致在450 K时的热导率低至〜1.2 W / m-K,与SiGe块相比,其热电品质因数(ZT)约为0.46,理论上在800 K时ZT甚至超过2。从同一纳米线“同时”测量所有热电性能,以促进准确的ZT测量。当纳米线直径超过〜100 nm时,表面边界散射会突出,而合金化在抑制声子传输时起着更重要的作用。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号