A method for measuring thermal conductivity and figure-of-merit of thermoelectric materials

摘要

The present invention relates to a method for measuring thermal conductivity and a thermal conductivity index of thermoelectric semiconductors. More particularly, an objective of the present invention is to provide a method for correcting an error due to a heat loss and heat generated by a material itself in a conductor occurring in a conventional Haman′s method. The method for correcting an error can be easily applied to more accurately evaluate performance and physical properties of thermoelectric semiconductors at various temperatures, and accurate evaluation of the properties of thermoelectric semiconductors can be useful for designing thermoelectric elements.