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首页> 外文期刊>Nano letters >Fabrication of a 34 x 34 Crossbar Structure at 50 nm Half-pitch by UV-based Nanoimprint Lithography
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Fabrication of a 34 x 34 Crossbar Structure at 50 nm Half-pitch by UV-based Nanoimprint Lithography

机译:通过基于紫外线的纳米压印光刻技术在50 nm半间距处制作34 x 34横杆结构

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We have developed a single-layer UV-nanoimprint process,which was utilized to fabricate 34 x 34 crossbar circuits with a half-pitch of 50 nm(equivalent to a bit density of 10 Gbit/cm~2).This process contains two innovative ideas to overcome challenges in the nanoimprint at shrinking dimensions.First,our new liquid resist formulation allowed us to minimize the residual resist layer thickness after curing and requires the relatively low imprint pressure of 20 psi.Second,by engineering the surface energy of the substrate we also eliminated the problem of trapped air during contact with the mold such that it spreads the resist and expels trapped air uniformly.Our overall process required fewer processing steps than any bilayer process and yielded high quality results at 50 nm half-pitch.
机译:我们开发了一种单层UV纳米压印工艺,该工艺用于制造半间距为50 nm(相当于10 Gbit / cm〜2的位密度)的34 x 34纵横制电路。该工艺包含两个创新首先,我们新的液体抗蚀剂配方使我们能够最大程度地减少固化后的残留抗蚀剂层厚度,并且需要相对较低的20 psi压印压力。其次,通过设计基材的表面能我们还消除了与模具接触时滞留空气的问题,该问题使模具散布了抗蚀剂并均匀地排出滞留的空气。我们的整个过程所需的加工步骤比任何双层工艺都要少,并且在50 nm半间距下可获得高质量的结果。

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