Corrective optics for diffraction of gamma-rays

摘要

A new method to correct imperfect bending of curved crystals used for x-ray diffraction spectroscopy is presented. It relies on using position-sensitive segmented Ge-detectors and permits the determination of the emission area of each x-ray from the crystals and therefore an off-line correction of bending imperfections as if the crystals were divided into independent 2 x 2 mm 2 bent crystals. A first experiment using the GAMS-5 spectrometer (Institut Laue-Langevin) shows proof of the principle of the method. (c) 2006 Elsevier B.V. All rights reserved.