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Does the baseline impedance measurement during radiofrequency catheter ablation influence the likelihood of an impedance rise?

机译:射频导管消融期间的基线阻抗测量是否会影响阻抗上升的可能性?

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摘要

Most radiofrequency energy delivery systems provide a baseline (pre-ablation) impedance measurement; however, the application of this value, particularly in avoiding catheter overheating and coagulum formation, has not been described. We evaluated the ability of the product of the power output P and the baseline impedance Z (P x Z) to predict the likelihood of an impedance rise and coagulum formation during radiofrequency energy delivery in 62 consecutive patients undergoing successful catheter ablation of the slow atrioventricular (AV) nodal pathway or an accessory pathway. The mean P x Z during the 114 pulses resulting in an impedance rise was 3,770 +/- 846 W omega; only 42 impedance rises in 14 patients occurred at a P x Z < 3,5000. For comparison, the P x Z during the single radiofrequency pulse that resulted in loss of preexcitation or the slow AV nodal pathway in the entire patient group was 3,118 +/- 590 (p = 0.001) and in only 9 patients was the P x Z > 3,500. this data suggest that adjusting the power during each radiofrequency pulse to maintain the P x Z < 3,500 should enable the operator to avoid most impedance rises.
机译:大多数射频能量传输系统提供基线(消融前)阻抗测量;然而,尚未描述该值的应用,特别是在避免导管过热和凝结物形成方面的应用。我们评估了功率输出P和基线阻抗Z(P x Z)的乘积,以预测62名连续成功进行慢房室消融的连续患者中射频能量输送过程中阻抗升高和血凝形成的可能性。 AV)节点路径或辅助路径。在114个脉冲中导致阻抗增加的平均P x Z为3,770 +/- 846 W欧米茄;在P x Z <3,5000时,只有14例患者的42阻抗升高。为了进行比较,在整个患者组中,单个射频脉冲导致的预激丧失或缓慢的AV结节路径的P x Z为3118 +/- 590(p = 0.001),只有9名患者为P x Z > 3500。该数据表明,在每个射频脉冲期间调整功率以保持P x Z <3500,应使操作员能够避免大多数阻抗上升。

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