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首页> 外文期刊>Measurement Science & Technology >Measuring out-of-plane displacements by electronic speckle-pattern interferometry (ESPI) and whole-field subtractive moire
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Measuring out-of-plane displacements by electronic speckle-pattern interferometry (ESPI) and whole-field subtractive moire

机译:通过电子散斑图案干涉仪(ESPI)和全场消减波纹测量平面外位移

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摘要

By using both electronic speckle-pattern interferometry (ESPI) and whole-field subtractive moire, we followed the changes in the topography of 1100 aluminium sheet samples subjected to uniaxial tensile tests. We compare the performance of both techniques and discuss their advantages and limitations. We observed that, during the transition zone to the stage of plastic deformation of the test, the sheet metal specimens were thinned mainly along a relatively broad inclined band that exhibited a remarkable degree of localization.
机译:通过同时使用电子散斑图干涉法(ESPI)和全场减法莫尔条纹,我们跟踪了经受单轴拉伸试验的1100个铝板样品的形貌变化。我们比较两种技术的性能,并讨论它们的优点和局限性。我们观察到,在过渡到测试塑性变形阶段的过程中,钣金样品主要沿相对宽的倾斜带变薄,该倾斜带表现出显着的局部化程度。

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