A new apparatus for the measurement of force-frequency effect of crystal resonators

摘要

We describe an apparatus for the measurement of the force-frequency effect of crystal resonators. The force-frequency effect is the correlation between the force put on the crystal resonator and the relative resonant frequency of the resonator to the input force. The new apparatus has been designed and manufactured to measure the force sensitivity coefficient K-f (m s/N), which relates to parameters such as crystal geometry, orientation angle, and force direction (azimuth angle). The new loading device has a better force resolution and is simpler to adjust for force alignment than traditional level-loading devices. In order to validate this new loading device, sample experiment tests have been performed, and a comparison of the experiment outcomes with peers' measurement results show a good agreement. (C) 2016 Elsevier Ltd. All rights reserved.