A nonlinearity test method for scan conversion-based transient digitizers

摘要

In digitizers based on scan convemon principles, a charge distribution corresponding to the input is stord on a semiconductor diode matrix in a cathodic tube .From this high-speed writing process peculiar errors, mainly related to the beam position on the matrix, arise. Owing to these peculiarities ,standard testing techniques are not to be very suitable for scan converters. In this paper ,a method for evaluating the nonlinearity trend versus the electron bean position on the target is proposed. Such a method also allows information on the dynamic characteristics of the target diodes to be gathered for diagnostic alms. The theory underlying the method is reported and experimental results of tests carried out on an actual scan conversion-based transient digitizer are discussed.#1997 Elsevier Science Ltd.