A mathematical modelling approach is proposed for measurement-based characterization of non-linear dynamic sources of error in the vertical channel of a sampling oscilloscope. The proposed approach has been derived from a recently proposed modified Volterra series expansion which, under particular conditions, provides fast convergence ad can be truncated to the first integral term. A possible characterization procedure, based on instrument testing under sinusoidal AC input signals with different frequencies and variable DC bias components, is described and used 0 evaluate the performances of a commercial oscilloscope. The waveforms obtained by using the identified model are prepared with the experimental ones for model validation; successively the model is used for the error compensation of the memory effects.#1998 Elsevier Science Ltd.
展开▼
