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Characterization of surface defects in fast tool servo machining of microlens array using a pattern recognition and analysis method

机译:利用模式识别和分析方法表征微透镜阵列的快速工具伺服加工中的表面缺陷

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摘要

Microlens array (MLA) is a type of structured freeform surfaces which are widely used in advanced optical products. Fast tool servo (FTS) machining provides an indispensible solution for machining MLA with superior surface quality than traditional fabrication process for MLA. However, there are a lot of challenges in the characterization of the surface defects in FTS machining of MLA. This paper presents a pattern recognition and analysis method (PRAM) for the characterization of surface defects in FTS machining of MLA. The PRAM makes use of the Gabor filters to extract the features from the MLA. These features are used to train a Support Vector Machine (SVM) classifier for defects detection and analysis. To verify the method, a series of experiments have been conducted and the results show that the PRAM produces good accuracy of defects detection using different features and different classifiers. The successful development of PRAM throws some light on further study of surface characterization of other types of structure freeform surfaces.
机译:微透镜阵列(MLA)是一种结构化的自由曲面,广泛用于高级光学产品中。快速工具伺服(FTS)加工为加工MLA提供了必不可少的解决方案,其表面质量优于传统的MLA制造工艺。但是,在MLA的FTS加工中表征表面缺陷方面存在许多挑战。本文提出了一种模式识别和分析方法(PRAM),用于表征MLA FTS加工中的表面缺陷。 PRAM利用Gabor滤波器从MLA中提取特征。这些功能用于训练支持向量机(SVM)分类器以进行缺陷检测和分析。为了验证该方法,已进行了一系列实验,结果表明,PRAM使用不同的特征和不同的分类器可以产生良好的缺陷检测精度。 PRAM的成功开发为进一步研究其他类型的结构自由曲面的表面表征提供了一些启示。

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