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Excess conductivity analysis in YBa2Cu3O7-d added with SiO2 nanoparticles and nanowires: Comparative study

机译:添加了SiO2纳米颗粒和纳米线的YBa2Cu3O7-d中的过量电导率分析:对比研究

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摘要

The effect of nanosized silicon oxide nanoparticles (denoted NP-SiO2) and nanowires (denoted NW-SiO2) additions during the final processing stage on electrical fluctuation conductivity of polycrystalline YBa2Cu3Oy (Y-123 for brevity) in the mean field region has been reported. Series of samples were synthesized in air using a standard solid-state reaction technique by adding nanosized entities up to 0.5 wt.%. Phases, microstructure and superconductivity properties have been systematically investigated using X-ray diffraction (XRD), transmission electron microscopy (TEM) and electrical measurements. TEM investigations show the presence of inhomogeneities embedded in the superconducting matrix along with the presence of columnar defects in the case of SiO2 nanoparticles added samples, however nanowires tend to agglomerate by entangling with each other in the intergrain regions. The fluctuation conductivity was analyzed as a function of reduced temperature using the Aslamazov Larkin model. Using the Lawrence Doniach equations, the Ginzburg Landau (GL) number (NG) and equations, the coherence length, the effective layer thickness, the lower critical field B-c1(0), the upper critical field B-c2(0) and the critical current density J(c)(0) were estimated. It was found that the addition of an optimum concentration of SiO2 nanomaterials, that depends on the shape, effectively controlled the microstructure, the grains coupling and hence improved the physical properties of Y-123 compound.
机译:已经报道了在最终处理阶段添加纳米尺寸的氧化硅纳米粒子(表示为NP-SiO2)和纳米线(表示为NW-SiO2)对平均场区域中多晶YBa2Cu3Oy(为简便起见,Y-123)的电波动电导率的影响。通过使用添加至多0.5 wt。%的纳米级实体,使用标准的固态反应技术在空气中合成一系列样品。已使用X射线衍射(XRD),透射电子显微镜(TEM)和电学测量系统地研究了相,微结构和超导性能。 TEM研究表明,在添加SiO2纳米颗粒的情况下,超导基质中嵌入了不均匀性,同时存在柱状缺陷,但是纳米线往往会在晶粒间区域相互缠结而发生团聚。使用Aslamazov Larkin模型分析了波动电导率与降低温度的函数。使用Lawrence Doniach方程,Ginzburg Landau(GL)数(NG)和方程,相干长度,有效层厚度,下临界场B-c1(0),上临界场B-c2(0)和估算了临界电流密度J(c)(0)。已经发现,取决于形状的最佳浓度的SiO 2纳米材料的添加有效地控制了微观结构,晶粒耦合,并因此改善了Y-123化合物的物理性能。

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