The application of automated electron beam mapping techniques to the characterisation of low grade, fine-grained mineralisation; potential problems and recommendations

摘要

Automated electron beam techniques using instruments such as the scanning electron microscope (SEM) and the electron probe micro analyser (EPMA) are commonly used by the mineral and metallurgical processing industries to characterise ore and feed materials. The correct choice of instrument and operating conditions is essential, yet often overlooked, and depends on parameters such as composition, particle size, heterogeneity and physical competency of the sample being examined, as well as the type of data sought.