Zeiss launches Crossbeam FIB-SEM systems for 3D nanotomography and nanofabrication

摘要

Carl Zeiss held a press conference at MC2013 in Regensburg to present the first system of its new Crossbeam series. The microscope system is available in two versions. The GEMINI IVP (variable pressure) column of Crossbeam 340 offers optimal analysis conditions for in-situ experiments with outgassing and charging specimens. With its GEMINI II column with double condenser system, Crossbeam 540 users benefit from more information in a shorter time. The system delivers high resolution, even with low voltage and high beam current, enabling fast analytics and ease of use.