New algorithms of the TSM and TOM methods for calibrating microwave test fixtures

摘要

Based on the conventional through-short-match(TSM) method, an impressed TSM method has been proposed its this Letter. This method gives an analytical solution and has almost all the advantages of conventional TSM methods. For example, it has no phase uncertainty and no bandwidth limitation. The experimental results show that the accuracy can be significantly improved with this method. The proposed theory can be applied to the through-open-match (TOM) method.