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Fixture de-embedding method and system for removing test fixture characteristics when calibrating measurement systems
Fixture de-embedding method and system for removing test fixture characteristics when calibrating measurement systems
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机译:在校准测量系统时消除测试夹具特性的夹具去嵌入方法和系统
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摘要
A method and system for measuring the input (loading) impedance of measurement systems using a test fixture. This is done by first measuring the characteristics of an unloaded test fixture to obtain scattering parameters of the test fixture and using a splitting algorithm to calculate the scattering parameters of each transmission line leg of the test fixture. The test fixture is then measured with a measurement system attached. The test fixture effects defined by the scattering parameters are then removed from the measurement to yield the scattering parameters of the measurement system alone (measurement system effects).
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