QUADRATURE PHASE-SHIFTED WHITE-LIGHT INTERFEROMETRY FOR THE MEASUREMENT OF SHORT-CAVITY EXTRINSIC FABRY-PEROT INTERFEROMETRIC SENSORS

摘要

A quadrature phase-shifted white-light interferometry is demonstrated to interrogate short-cavity extrinsic Fabry-Perot interferometric (EFPI) sensors. The absolute cavity length of an EFPI can be recovered by constructing two quadrature signals using the white-light spectrum of the EFPI. Experimental results show that the measurement resolution can be improved, and a linear output is obtained when interrogating an EFPI temperature sensor.