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Experimental and numerical analyses of thick-film piezoceramic structures for miniaturised sensors and actuators

机译:用于小型传感器和执行器的厚膜压电陶瓷结构的实验和数值分析

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摘要

Purpose - The successful use of piezoceramic thick films in sensors and actuators requires a thorough understanding of their electrical and electromechanical characteristics. Since these characteristics depend not only on the material's composition but also on its compatibility with various substrates and a number of processing parameters, accurate measurements of the material's parameters are essential. Here, the aim of this paper is to present a procedure for characterising lead-zirconate-titanate (PZT) thick films on pre-fired low-temperature co-fired ceramic (LTCC) substrates performed in order to determine the material parameters for numerical modelling. Design/methodology/approach - Owing to the lack of standard procedures for measuring the elastic and piezoelectric properties of the films, the compliance parameters were evaluated from the results of nano-indentation tests, and a substrate-flexure method was used to evaluate the transverse piezoelectric coefficients. Findings - The validation of the material model and the finite-element (FE) analysis of the demonstrator sensor/actuator structures are shown to be in agreement with the FE model, even if not an exact fit. Originality/value - This paper focuses on a characterisation of PZT thick films screen-printed on pre-fired LTCC substrates.
机译:目的-压电陶瓷厚膜在传感器和执行器中的成功使用需要对它们的电气和机电特性有透彻的了解。由于这些特性不仅取决于材料的成分,还取决于其与各种基材的相容性和许多处理参数,因此精确测量材料的参数至关重要。在此,本文的目的是提出一种在预烧的低温共烧陶瓷(LTCC)基板上表征锆钛酸铅(PZT)厚膜的程序,以确定用于数值建模的材料参数。设计/方法/方法-由于缺乏测量膜的弹性和压电特性的标准程序,因此根据纳米压痕测试的结果评估了顺应性参数,并使用了基底挠曲法来评估横向压电系数。结果-材料模型的验证和演示器传感器/执行器结构的有限元(FE)分析显示与FE模型一致,即使不是完全合适。原创性/价值-本文着重于在预烧LTCC基板上丝网印刷的PZT厚膜的特性。

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