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Focused ion beam recovery of hypervelocity impact residue in experimental craters on metallic foils

机译:聚焦离子束在金属箔上的实验弹坑中超高速撞击残留物的回收

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摘要

The Stardust sample return capsule returned to Earth in January 2006 with primitive debris collected from comet 81P/Wild-2 during the flyby encounter in 2004. In addition to the cometary particles embedded in low-density silica aerogel, there are microcraters preserved in the aluminum foils (1100 series; 100 mu m thick) that are wrapped around the sample tray assembly. Soda lime spheres (similar to 49 mu m in diameter) have been accelerated with a light gas gun into flight-grade aluminum foils at 6.35 kin s(-1) to simulate the capture of cometary debris. The experimental craters have been analyzed using scanning electron microscopy (SEM) and X-ray energy dispersive spectroscopy (EDX) to locate and characterize remants of the projectile material remaining within the craters. In addition, ion beam-induced secondary electron imaging has proven particularly useful in identifying areas within the craters that contain residue material. Finally, high-precision focused ion beam (FIB) milling has been used to isolate and then extract an individual melt residue droplet from the interior wall of an impact. This has enabled further detailed elemental characterization that is free from the background contamination of the aluminum foil Substrate. The ability to recover "pure" melt residues using FIB will significantly extend the interpretations of the residue chemistry preserved in the aluminum foils returned by Stardust.
机译:星尘样品返回舱于2006年1月返回地球,在2004年的飞越相遇期间从81P / Wild-2彗星收集了原始碎片。除了嵌入低密度硅胶气凝胶的彗星颗粒外,铝中还保留有微陨石坑包裹样品托盘组件的金属箔(1100系列; 100微米厚)。用轻气枪将苏打石灰球(直径约49微米)加速到飞行级铝箔中,速度为6.35 kins(-1),以模拟捕获彗星碎片。已经使用扫描电子显微镜(SEM)和X射线能量色散谱(EDX)对实验的陨石坑进行了分析,以定位和表征残留在陨石坑中的弹丸材料的残留物。此外,离子束感应的二次电子成像已被证明在识别陨石坑内包含残留物质的区域特别有用。最后,高精度聚焦离子束(FIB)铣削已被用于隔离,然后从撞击的内壁提取单个熔渣残滴。这使得能够进行更详细的元素表征,而不受铝箔基材的背景污染。使用FIB回收“纯”熔融残留物的能力将大大扩展对Stardust返回的铝箔中保留的残留化学物质的解释。

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