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New method for interferometric measurement of gauge blocks without wringing onto a platen

机译:无需拧到台板上即可进行量块干涉测量的新方法

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摘要

A new method, using a novel double-ended interferometer, is described for .the highly efficient calibration of gauge blocks. Unlike the conventional K#sters interferometric method, the new method does not require wringing of the gauge block onto an auxiliary platen. Although the gauge block length defined by International Standard 3650 (Gauge blocks) can be obtained using the K#sters method, the wringing operation is a laborious process, which requires skill, sometimes causes contact errors and decreases measuring efficiency, and prevents a fully automated measuring operation. The new interferometer can also be used as a conventional K#sters interferometer by changing some of the optical systems Thus, after preliminary investigations measuring some samples using the K6sters method, we can determine an accurate correction value, dependent on the phase shift of light at the reflecting surface, to obtain the gauge block length defined by ISO 3650 The results, obtained from experimental work and theoretical analysis, show that the combined standard uncertainty of a gauge block length up to 100 mm is less than 16 nm, and this value is nearly the same as that obtained by the conventional K6sters method.
机译:描述了一种使用新型双端干涉仪的新方法,用于量规的高效校准。与传统的K#sters干涉测量方法不同,新方法不需要将量规块拧到辅助压板上。尽管可以使用K#sters方法获得国际标准3650(量块)定义的量块长度,但拧紧操作是一项费力的过程,需要技巧,有时会导致接触错误并降低测量效率,并妨碍了全自动操作测量操作。通过更改某些光学系统,新的干涉仪也可以用作常规的K#sters干涉仪。因此,在初步研究中使用K6sters方法测量了一些样品之后,我们可以根据光在光源上的相移来确定准确的校正值。反射面,以获得ISO 3650定义的量块长度。从实验工作和理论分析中获得的结果表明,最大100 mm的量块长度的组合标准不确定度小于16 nm,该值为几乎与传统K6sters方法获得的结果相同。

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