...
首页> 外文期刊>Metallurgical and Materials Transactions, A. Physical Metallurgy and Materials Science >An Electron-Backscattered Diffraction Study of the Texture Evolution in a Coarse-Grained AZ31 Magnesium Alloy Deformed in Tension at Elevated Temperatures
【24h】

An Electron-Backscattered Diffraction Study of the Texture Evolution in a Coarse-Grained AZ31 Magnesium Alloy Deformed in Tension at Elevated Temperatures

机译:在高温下拉伸变形的粗粒AZ31镁合金中织构演变的电子背散射衍射研究

获取原文
获取原文并翻译 | 示例

摘要

Electron-backscattered diffraction (EBSD) has been used to investigate the texture evolution during tensile deformation at temperatures between 673 and 773 K of a coarse-grained commercial AZ31 magnesium alloy. A weak (0001) fiber texture was initially present in the hot-rolled magnesium alloy plate. The [0001] directions of the grains spread 0 to 45 deg around the normal direction (ND) of the magnesium alloy plate. This pre-existing weak texture evolved during tensile deformation into a strong texture close to the {0001} <1100>. The [0001] directions of the grains rotated toward the orientations perpendicular to the tension axis of the samples, indicating that the {0001} <1120> slip system appeared to be the most active slip system, especially in the early stages of deformation. The EBSD Schmid-factor analysis revealed that, however, with an increase in strain and the rotation of the (0001) slip plane, the {1122} <1123> slip system appeared to be more favorable. The {1 TOO} <1120> and {1101} <1120> slip systems remained favored throughout the strains investigated, indicating that {1100} and {1101} are two important slip planes for cross slip using the <1120> slip vector. It is found that the misorientation across one coarse grain (as high as 38.2 deg) is accommodated by low-angle grain boundaries (LAGBs). The formation of these LAGBs may be an intermediate stage of the coarse grain refinement that occurred during deformation.
机译:电子背散射衍射(EBSD)已被用于研究粗糙晶粒商业化AZ31镁合金在673至773 K之间的温度下拉伸变形过程中的织构演变。最初在热轧镁合金板上存在较弱的(0001)纤维织构。晶粒的[0001]方向围绕镁合金板的法线方向(ND)散布0至45度。该先前存在的弱纹理在拉伸变形过程中演变为接近{0001} <1100>的强纹理。晶粒的[0001]方向朝垂直于样品张力轴的方向旋转,表明{0001} <1120>滑移系统似乎是最活跃的滑移系统,尤其是在变形的早期。 EBSD Schmid因子分析显示,但是,随着应变的增加和(0001)滑动面的旋转,{1122} <1123>滑动系统似乎更为有利。在所有研究的应变中,{1 TOO} <1120>和{1101} <1120>滑动系统仍然受到青睐,这表明{1100}和{1101}是使用<1120>滑动向量进行交叉滑动的两个重要滑动平面。结果发现,低角度晶界(LAGB)可以解决一个粗晶粒(高达38.2度)的取向错误。这些LAGB的形成可能是在变形过程中发生的粗晶粒细化的中间阶段。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号