首页> 外文期刊>Electronics Newsweekly >Researchers Submit Patent Application, 'Method For Producing Semiconductor Substrate, Semiconductor Substrate, And Method For Preventing Crack Occurrence In Growth Layer', for Approval (USPTO 20230203704)
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Researchers Submit Patent Application, 'Method For Producing Semiconductor Substrate, Semiconductor Substrate, And Method For Preventing Crack Occurrence In Growth Layer', for Approval (USPTO 20230203704)

机译:研究人员提交专利申请,“半导体衬底的生产方法、半导体衬底和防止生长层发生裂纹的方法”(USPTO 20230203704)

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News editors obtained the following quote from the background information supplied by theinventors: “Conventionally, in manufacturing a semiconductor substrate, a semiconductor substrate ofa desired semiconductor material is manufactured by crystal-growing a semiconductor material (a so-calledheteroepitaxial growth) that is different from an underlying substrate on the underlying substrate.“However, in the heteroepitaxial growth, it has been regarded as a problem that occurrence of cracks,occurrence of dislocations, deterioration of surface morphology, warpage of the substrate, and the like, ina growth layer are present due to difference in lattice constant and thermal expansion coefficient betweenthe two materials.
机译:新闻编辑从发明人提供的背景信息中获得了以下引述:“传统上,在制造半导体衬底时,所需半导体材料的半导体衬底是通过晶体生长半导体材料(所谓的异质外延生长)来制造的,该半导体材料不同于底层衬底上的底层衬底。然而,在异质外延生长中,由于两种材料之间的晶格常数和热膨胀系数不同,生长层中存在裂纹发生、位错发生、表面形貌恶化、基体翘曲等问题。

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