...
首页> 外文期刊>Materials science in semiconductor processing >High-voltage and low specific on-resistance power UMOSFET using P and N type columns
【24h】

High-voltage and low specific on-resistance power UMOSFET using P and N type columns

机译:使用P型和N型列的高压和低导通电阻功率UMOSFET

获取原文
获取原文并翻译 | 示例

摘要

For the first time, we present the unique features exhibited by power 4H-SiC UMOSFET in which N and P type columns (NPC) in the drift region are incorporated to improve the breakdown voltage, the specific on-resistance, and the total lateral cell pitch. The P-type column creates a potential barrier in the drift region of the proposed structure for increasing the breakdown voltage and the N-type column reduces the specific on-resistance. Also, the JFET effects reduce and so the total lateral cell pitch will decrease. In the NPC-UMOSFET, the electric field crowding reduces due to the created potential barrier by the NPC regions and causes more uniform electric field distribution in the structure. Using two dimensional simulations, the breakdown voltage and the specific on-resistance of the proposed structure are investigated for the columns parameters in comparison with a conventional UMOSFET (C-UMOSFET) and an accumulation layer UMOSFET (AL-UMOSFET) structures. For the NPC-UMOSFET with 10 mu m drift region length the maximum breakdown voltage of 1274 V is obtained, while at the same drift region length, the maximum breakdown voltages of the C-UMOSFET and the AL-UMOSFET structures are 534 and 703 V, respectively. Moreover, the proposed structure exhibits a superior specific on-resistance (R-on,R-sp) of 2 m Omega cm(2), which shows that the on-resistance of the optimized NPC-UMOSFET are decreased by 56% and 58% in comparison with the C-UMOSFET and the AL-UMOSFET, respectively. (C) 2015 Elsevier Ltd. All rights reserved.
机译:首次,我们展示了功率4H-SiC UMOSFET所展现的独特功能,其中在漂移区中结合了N和P型柱(NPC)以改善击穿电压,特定的导通电阻和整个横向电池沥青。 P型柱在所提出的结构的漂移区中形成势垒,用于增加击穿电压,而N型柱则降低了比导通电阻。同样,JFET效应减小,因此总的横向单元间距将减小。在NPC-UMOSFET中,由于NPC区域创建的势垒,电场拥挤有所减少,并导致结构中的电场分布更加均匀。与传统的UMOSFET(C-UMOSFET)和累积层UMOSFET(AL-UMOSFET)结构相比,使用二维模拟,针对列参数研究了所提出结构的击穿电压和特定的导通电阻。对于漂移区长度为10μm的NPC-UMOSFET,获得的最大击穿电压为1274 V,而在相同的漂移区长度下,C-UMOSFET和AL-UMOSFET结构的最大击穿电压为534和703 V , 分别。此外,所提出的结构具有2 m Omega cm(2)的优异的比导通电阻(R-on,R-sp),这表明优化的NPC-UMOSFET的导通电阻降低了56%和58分别与C-UMOSFET和AL-UMOSFET的百分比。 (C)2015 Elsevier Ltd.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号