...
首页> 外文期刊>Materials Science and Technology: MST: A publication of the Institute of Metals >Characterisation of interfacial imperfections of TiAl and 40Cr diffusion bonding by ultrasonic amplitude and phase
【24h】

Characterisation of interfacial imperfections of TiAl and 40Cr diffusion bonding by ultrasonic amplitude and phase

机译:超声振幅和相位表征TiAl和40Cr扩散键合的界面缺陷

获取原文
获取原文并翻译 | 示例

摘要

A characteristics extraction algorithm is proposed to characterise the interfacial imperfections in TiAl and 40Cr diffusion bonding. The algorithm is based on analysing the variation of the ultrasonic amplitude and phase after interacting with the bonding interface. Ultrasonic measurements were performed by an ultrasonic imaging testing system, and broadband transducers with central frequency of the 10 and 20 MHz were employed. Metallographic analyses and shear tests were also performed on the joints. It was found that the amplitude of the reflection coefficient is almost a constant, and the phase of the reflection coefficient is the same for the perfectly bonded interface; for the kissing bond interface, the amplitude increases with the ultrasonic frequency, and the phase is the same at the low frequencies and opposite at the high frequencies; the amplitude does not vary with the frequency, and the phase is opposite for the unbonded interface.
机译:提出了一种特征提取算法来表征TiAl和40Cr扩散键合中的界面缺陷。该算法基于分析与键合界面相互作用后超声振幅和相位的变化。通过超声成像测试系统进行超声测量,并使用中心频率为10和20 MHz的宽带传感器。还对接头进行了金相分析和剪切试验。发现反射系数的幅度几乎是恒定的,并且对于完美结合的界面,反射系数的相位是相同的。对于接键界面,其振幅随超声频率的增加而增大,低频时的相位相同,高频时的相位相反。振幅不随频率而变化,并且对于未结合的界面,相位相反。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号