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Investigating conduction mechanism and frequency dependency of nanostructured memristor device

机译:纳米结构忆阻器器件的导电机理和频率依赖性研究

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The present paper depicts the simulation of conduction mechanism and frequency dependency of nanostructured memristor device. The simulation of memristor is carried out using linear drift model of memristor. Further effect of various frequencies on memristor device has been investigated. We present the simulation proof of Limiting Linear Characteristics theorem or Frequency Dependent Theorem of memristor device. Moreover, the nanoscopic conduction mechanism of memristor device is simulated and it is found that the Low Resistance State (LRS) of memristor device follows the Ohmic conduction mechanism. The conduction mechanism in the High Resistance State (HRS) is found to be very complex one and follows the space charge limited current (SCLC) theory. (C) 2015 Elsevier Ltd. All rights reserved.
机译:本文描述了纳米结构忆阻器器件的导电机理和频率依赖性的仿真。使用忆阻器的线性漂移模型进行忆阻器的仿真。已经研究了各种频率对忆阻器器件的进一步影响。我们提出了忆阻器器件的极限线性特征定理或频率相关定理的仿真证明。此外,对忆阻器器件的纳米传导机理进行了仿真,发现忆阻器器件的低电阻状态(LRS)遵循欧姆传导机理。高阻态(HRS)的传导机制非常复杂,并且遵循空间电荷限制电流(SCLC)理论。 (C)2015 Elsevier Ltd.保留所有权利。

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