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首页> 外文期刊>Materials science in semiconductor processing >Fabrication of porous ZnO via electrochemical etching using 10 wt potassium hydroxide solution
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Fabrication of porous ZnO via electrochemical etching using 10 wt potassium hydroxide solution

机译:使用10 wt%氢氧化钾溶液通过电化学蚀刻制备多孔ZnO

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We described the fabrication of porous ZnO using the electrochemical etching method. ZnO thin films deposited by radiofrequency sputtering were etched electrochemically using 10 wt KOH solution as an etching medium to obtain porous ZnO surface structure. A constant voltage of 15 V was applied to enhance the etching process. The etched samples were then characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), and photoluminescence (PL) spectroscopy to examine their structural and optical properties. XRD spectra showed that by performing the electrochemical etching process, porous ZnO could be obtained without severely deteriorating the crystallinity of the samples. Moreover, SEM characterization revealed that hillock-type porous ZnO was fabricated successfully. In addition, the cross-sectional SEM images revealed that there were only minimal changes in the layer thickness after the ZnO had been etched for various lengths of time. This finding shows the dominance of the vertical etching process. Notably, the intensity of PL spectra increased and the PL excitation peak exhibited a red shift trend as the etching time increased. These observations are due to the increase of the surface to volume ratio of the ZnO surface and the strain relaxation along the dislocation and grain boundary.
机译:我们描述了使用电化学蚀刻方法制造多孔ZnO。使用10wt%KOH溶液作为蚀刻介质,对通过射频溅射沉积的ZnO薄膜进行电化学蚀刻,以获得多孔ZnO表面结构。施加15 V的恒定电压以增强蚀刻过程。然后通过X射线衍射(XRD),扫描电子显微镜(SEM)和光致发光(PL)光谱对刻蚀后的样品进行表征,以检查其结构和光学性质。 XRD光谱表明,通过进行电化学蚀刻工艺,可以获得多孔ZnO,而不会严重降低样品的结晶度。此外,SEM表征表明成功制备了小丘型多孔ZnO。另外,横截面SEM图像显示在将ZnO蚀刻各种长度的时间之后,层厚度仅有最小的变化。这一发现表明了垂直蚀刻工艺的优势。值得注意的是,随着蚀刻时间的增加,PL光谱的强度增加并且PL激发峰呈现出红移趋势。这些观察结果是由于ZnO表面的表面体积比增加以及沿位错和晶界的应变松弛所致。

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