A retarding field display analyzer, similar to thatused in LBBD, is discussed. It uses four retarding field grids andprojects the electron distribution onto a hemispherical phosphorscreen. However, this analyzer has no coaxial electron gun, whichpermits measurements of electron intensity over a large angularrange. A fiber-optic faceplate projects the hemispherical imageonto a plane, where the light intensity is measured ex situ with ahigh dynamic range CCD camera. This analyzer is optimized forangle-resolved Auger and photoemission spectroscopy. Weevaluate the effectiveness of this analyzer for the measurement ofangle-resolved diffraction patterns for use in electron holography.
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