首页> 外文期刊>Materials transactions >Effect of Additive-Free Plating and High Heating Rate Annealing on the Formation of Low Resistivity Fine Cu Wires
【24h】

Effect of Additive-Free Plating and High Heating Rate Annealing on the Formation of Low Resistivity Fine Cu Wires

机译:无添加电镀和高加热速率退火对低电阻细铜丝形成的影响

获取原文
获取原文并翻译 | 示例
           

摘要

Low resistivity Cu wires were developed by the combination of lessening impurities through additive-free plating and high heating rate annealing. Resistivities of Cu wires made with the new method were about 30% lower than those made by conventional plating with additives and annealing at the same temperature in H_2. Low resistivity Cu wires were realized even at temperatures 100K lower than conventional annealing temperatures due to substantial grain growth by the high heating rate annealing in the Cu wires made with the additive-free plating.
机译:低电阻率的铜线是通过无添加剂电镀减少杂质和高加热速率退火相结合而开发的。用新方法制得的铜线的电阻率比传统的添加添加剂并在相同温度下在H_2中退火的铜线的电阻率低约30%。即使在比常规退火温度低100K的温度下,由于采用无添加剂电镀制成的铜线中的高加热速率退火引起的大量晶粒生长,也实现了低电阻率的铜线。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号